|Statement||by Bharat Bhushan, Harald Fuchs ; edited by Phaedon Avouris, Bharat Bhushan, Dieter Bimberg, Klaus von Klitzing, Hiroyuki Sakaki, Roland Wiesendanger|
|Series||NanoScience and Technology|
|Contributions||Avouris, Phaedon, 1945-, Bimberg, Dieter, Fuchs, Harald, Klitzing, Klaus von, Sakaki, Hiroyuki, 1944-, Wiesendanger, R. (Roland), 1961-, SpringerLink (Online service)|
|The Physical Object|
|Format||[electronic resource] :|
|ISBN 10||9783540850366, 9783540850373|
Book Title Applied Scanning Probe Methods XI Book Subtitle Scanning Probe Microscopy Techniques Editors. Bharat Bhushan; Harald Fuchs; Series Title NanoScience and Technology Copyright Publisher Springer-Verlag Berlin Heidelberg Copyright Holder Springer-Verlag Berlin Heidelberg eBook ISBN DOI / Hardcover ISBN. Applied Scanning Probe Methods Xiii Applied Scanning Probe Methods Xiii by Bharat Bhushan. Download it Applied Scanning Probe Methods Xiii books also available in PDF, EPUB, and Mobi Format for read it on your Kindle device, PC, phones or tablets. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. XI to measure small-scale mechanical properties have been devised, including ones based on indentation , on ultrasonics [5,6], and Applied Scanning Probe Methods XI other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth. XI contains contributions about recent developments in scanning probe microscopy techniques. Applied Scanning Probe Methods XI Bhushan, Bharat Publication: Applied Scanning Probe Methods XIII, NanoScience and Technology. Pub Date: DOI: / Bibcode: .B Keywords: Chemistry; Nanotechnology; Surfaces and Interfaces; Thin Films; Polymer Sciences; Physical Chemistry;.
Books & CD ROMs Show all 14 results. ADD ALL 14 Results TO MARKED ITEMS Special Cover Type This title is currently reprinting. You can pre-order your copy now. Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques. Series: NanoScience and Technology. Bhushan, Bharat, Fuchs, Harald (Eds.) The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out . The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes. Applied Scanning Probe Methods XII Characterization. Editors (view affiliations) Bharat Bhushan; Harald Fuchs; Book. 11 Citations; k Downloads; Part of the NanoScience and Technology book series (NANO) Log in to check access. Buy eBook. USD .
This volume examines the physical and technical foundation for progress in applied scanning probe techniques. It first introduces scanning probe microscopy, including sensor technology and tip characterization, and then details various industrial applications. Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques. Editors: Bhushan, Bharat, Fuchs, Harald (Eds.) Free Preview. This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January , the second to fourth volumes in early and the fifth to seventh volumes in late The field is progressing so fast.